Geometrical patterns based cross-scale image registration for AFM and optical microscopy
Published in 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2019
Recommended citation: Ziqi Hu, Zhi Fan, Cunhuan Liu, Yinan Wu, and Chao Wang. (2019). "Geometrical patterns based cross-scale image registration for AFM and optical microscopy." 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 276-280.
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